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Gallium
Nitride on Sapphire templates |
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GaN template may be used as a
substrate for III-V nitride epitaxial growth by MBE, MOCVD and The following GaN
epi on Sapphire are available ·
i-GaN, high resistivity,
Zn-compensated ·
a-plane GaN on
r-plane Sapphire |
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Applications. ·
Ideal
substrates for GaN homoepitaxial growth and device manufacturing. ·
Excellent material for production, product
development and fundamental research
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New type of substrate for GaN-based
Blue/Green/White/UV LEDs. ·
Substrates for
III-V nitride epitaxial growth by MBE, MOCVD and ·
Thick GaN is
enabling new applications like High Brightness LEDs manufactured with Laser
Lift Off |
Undoped GaN
Typical Properties
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Template type |
5 |
10 |
15 |
20 |
30 |
40 |
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Average thickness of GaN, microns |
3-7 |
7-12 |
12-17 |
17-25 |
25-35 |
35-45 |
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FWHM of x-ray RC omega-scan (00.2), arcsec |
<400 |
<350 |
<320 |
<300 |
<270 |
<250 |
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Typical dislocation
density, cm-2 |
(2-7)E8 |
2E8 – 5E7 |
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Typical electron mobility, cm2/V sec |
>500 |
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Doping |
Undoped |
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Concentration Nd-Na, cm-3 * |
<9E16 |
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GaN Conductivity |
n-type |
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Thickness standard deviation |
<10% |
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Typical sapphire substrate
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c-plane, single side polished ** |
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Typical diameter, inch |
2*** |
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Surface of GaN |
As grown, typical
Rms<1nm**** |
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GaN orientation |
(0001) |
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n-type GaN, Si-doped Typical Properties
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Template type |
5 |
10 |
15 |
20 |
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Average thickness of GaN, microns |
3-7 |
7-12 |
12-17 |
17-25 |
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FWHM of x-ray RC omega-scan (0002), arcsec |
<400 |
<350 |
<320 |
<300 |
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Typical dislocation
density, cm-2 |
(2-7)E8 |
2E8 – 5E7 |
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Doping |
Si, doping
profile see below |
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Typical concentration Nd-Na, cm-3 * |
(1-3)E18 |
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GaN Conductivity |
n-type |
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Thickness standard deviation |
<10% |
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Typical sapphire substrate |
c-plane, single side polished ** |
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Typical diameter, inch |
2*** |
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Surface of GaN |
As grown, typical
Rms<1nm**** |
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GaN orientation |
(0001) |
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For n-GaN templates, Si-doping
profile can be customized depending on application. Here are typical Si-doping
profiles for different applications. |
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Uniform doping |
Graded doping GaN-based
HB LEDs |
Sandwiched doping GaN-based
HB LEDs both
sides contacts |
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Applications |
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p-type GaN, Mg-doped Typical Properties
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Template type |
5 |
10 |
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Average thickness of GaN, microns |
2-5 |
5-10 |
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FWHM of x-ray RC omega-scan (0002), arcsec |
<450 |
<400 |
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Doping |
Mg |
Mg |
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Concentration Na-Nd, cm-3 * |
Option 1: (1-9)E17 Option 2:
(1-6)E18 |
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GaN Conductivity |
p-type* |
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Thickness standard deviation |
<10% |
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Typical sapphire substrate |
c-plane, single side polished ** |
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Typical diameter, inch |
2*** |
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Surface of GaN |
As grown, typical
Rms<1nm**** |
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GaN orientation |
(0001) |
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Treatment |
As grown or annealed |
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A Zn-compensated, high
resistivity GaN buffer layer can be introduced
between sapphire
and p-GaN layer
i-type GaN, high resistivity,
Zn-compensated Typical Properties
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Template type |
5 |
10 |
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Average thickness of GaN, microns |
2-5 |
5-10 |
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FWHM of x-ray RC omega-scan (0002), arcsec |
<450 |
<400 |
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Doping |
Zn |
Zn |
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Resistivity, Ohm cm (300 K) |
>1E5 |
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Thickness standard deviation |
<10% |
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Typical sapphire substrate |
c-plane, single side polished ** |
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Typical diameter, inch |
2*** |
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Surface of GaN |
As grown, typical
Rms<1nm**** |
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GaN orientation |
(0001) |
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* Measured by a CV meter with
mercury probe ** Growth on Double Side
Polished sapphire; on R-plane and A-plane sapphire is possible *** 3-inch, and 4-inch diameter is also available **** More rough surface at Rms = 2-5 nm can be also supplied Two types of templates are available: 1. Standard grade, usable area >90% 2. Research grade, usable area >80% Exclusion
area – 2mm periphery region Research grade templates of all types are supplied at reduced
price subject of availability. Contact TDI for additional information, prices and availability of templates Details
of surface morphology and optical properties of GaN templates |